VABS: Powering Simple Beam Elements with Detailed 3D FEA Fidelity

By Wenbin Yu

Purdue University

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Abstract

This presentation gives a brief introduction to VABS, a general-purpose cross-sectional analysis, which can power conventional, simple beam elements with detailed 3D FEA fidelity. 

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Researchers should cite this work as follows:

  • Wenbin Yu (2017), "VABS: Powering Simple Beam Elements with Detailed 3D FEA Fidelity," https://cdmhub.org/resources/1316.

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